Studies of electrical and optical properties of Sn doped and undoped ZnO thin films by the spray pyrolysis method
DOI:
https://doi.org/10.29105/qh1.2-76Palabras clave:
Spray pyrolysis, Electrical, OpticalResumen
Undoped and tin (Sn) doped zinc oxide (ZnO) thin film have been deposited by spray pyrolysis method of zinc acetate and tin chloride. Toe concentration ratio of[Sn ]/ [Zn] was varied from 0-5 at %. Toe effect of doping Sn on physical and optical properties was studied by different techniques such as X-ray diffraction for structural characterization, SEM for thickness and morphology, UV-Vis spectroscopy for optical properties, Hall effect and photoconductivity for electrical characterization. X-ray diffraction (XRD) patterns show that the films deposited are polycrystalline with (002) plane as the preferential orientation. According to Scherrer's equation, grain size values on the films are found between 30 - 45 nm with spherical shape. Optical transmittance was about 92% in visible range for the optimum film and shows that the band gap decreases from 3 .29 to 3.17 e V.
Descargas
Citas
-[1] Malle Krunks, Enn Mellikov, J. Thin Solid Films 270 (1995) 33-36. DOI: https://doi.org/10.1016/0040-6090(95)06893-7
-[2] U. Ozgur, Ya.I. Alikov, C. Liu, A. Teke, M.A. Reshchikov, S. Dogan, V. Avrutin, S.J. Cho, H. Morko, J. Appl. Phys. 98 (04130) (2005) 1-98. DOI: https://doi.org/10.1063/1.1992666
-[3] V.A. Karpina, V.L. Lazorenko, C.V. Lashkarev, V.D. Dobrowski, K.L. Kopylova, V.A. Baturin, S.A. Pustovoytov, A.Ju. Karpenko, Cryst. Res. Technol. 39 (2004) 980-992. DOI: https://doi.org/10.1002/crat.200310283
-[4] S. Major,A. Banerjee,K.L. Chopra, Thin Solid Films 125 (1985) 179-185. DOI: https://doi.org/10.1016/0040-6090(85)90411-0
-[5] F. Paraguay, M. Miki-Yoshida, J. Morales, J. So lis, W. Estrada, Superficies y Vacio 9 (1999) 245-247.
-[6] C.A.O. Yongee, Lei Miao, Sakae Tanemura, Masaki Tanemura, Yohei Kuno, Yasuhiko Hahashi, Yukimasa Mori, Jpn. J. Appl. Phys. 45 (2006) 1623-1628. DOI: https://doi.org/10.1143/JJAP.45.1623
-[7] T.A. Polley, W.B. Carter,D.B. Poker, ThinSolid Films357 (1999) 132-136. DOI: https://doi.org/10.1016/S0040-6090(99)00646-X
-[8] B. Kotlyarchuk, V. Savnuck, M. Oszwaldowski, Cryst. Res. Technol. 40 (2005) 1118-1123. DOI: https://doi.org/10.1002/crat.200410502
-[9] Susan Huang, Tatiana Kaydanova, Alex Miedaner, David S. Ginley, U.S. Dept.Energy J. Undergraduate Res. 4 (2004) 70-73.
-[10] Mujdat Caglar, Yasemin Caglar, Saliha Ilican, Phys. Stat. Sol. 4 (3) (2007) 1337-1343. DOI: https://doi.org/10.1002/pssc.200673744
-[11] F. Paraguay, D.J. Morales, W. Estrada, L.E. Andrade, M. Miki-Yoshida, Thin So lid Films 366 (2000) 16---27. DOI: https://doi.org/10.1016/S0040-6090(00)00752-5
-[12] T. Prasada Rao, M.C. Santhoshkumar, J. Applied Surface Science 255 (2009) 7212-7215. DOI: https://doi.org/10.1016/j.apsusc.2009.03.065
-[13] D.F. Paraguay, L.W. Estrada, D.R. Acosta, M.E. Andrade, Miki Yoshida, Thin Solid Films 350 (1999) 192. DOI: https://doi.org/10.1016/S0040-6090(99)00050-4
Descargas
Publicado
Cómo citar
Número
Sección
Licencia
Derechos de autor 2011 A. Arato, S.M. García Montes , G. Alan Castillo , T.K. Dasroy
Esta obra está bajo una licencia internacional Creative Commons Atribución 4.0.