GONZALEZ, Erick; PEÑA, Yolanda; GOMEZ, Idalia; ILDUSOVICH, Boris; HERNANDEZ, Tomas; CAVAZOS, José Luis. Characterization of CusBiS3 thin films annealing layers of BizS3-CuS chemically deposited . Quimica Hoy, [S. l.], v. 11, n. 04, p. 6–9, 2022. DOI: 10.29105/qh11.04-312. Disponível em: https://quimicahoy.uanl.mx/index.php/r/article/view/312. Acesso em: 21 nov. 2024.