RAMOS BLAZQUEZ, Reiner; SOLÍS POMAR, F.; FUNDORA, A.; PÉREZ TIJERINA, E. Effect of Deposition Time on the Structural Properties of RF-Sputtered Aluminum Thin Films. Quimica Hoy, [S. l.], v. 14, n. 03, p. 10–14, 2026. DOI: 10.29105/qh14.03-498. Disponível em: https://quimicahoy.uanl.mx/index.php/r/article/view/498. Acesso em: 11 jun. 2026.